Measuring the total electron emission yield of dielectric materials remains a
challenging task. Indeed, the charge induced by irradiation and electron
emission disturbs the measurement. It is therefore important to quantify this
charge during the measurement. Using a Kelvin probe allows both the emission
yield and the induced charge to be measured. Cependant, this method requires the
probe to be placed inside the vacuum chamber, which is often complicated or
even impossible. We propose a complete redesign of this method to overcome this
issue. A capacitive coupling now allows the potential probe to be placed
outside the chamber, in ambient atmosphere. Beyond this major simplification in
implementation, we have also introduced several improvements that simplify the
measurement protocol and reduce the overall measurement time. The new method
was first validated on a metallic sample (Cu), and subsequently applied to a
polymer (Kapton).

Cet article explore les excursions dans le temps et leurs implications.

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